InhaltsangabeContributing Authors. Preface. To Christian: a Real Test & Taste Expert. From LAAS to LIRMM and Beyond.

1. Open Defects in Nanometer Technologies; J. Figueras, R. Rodríguez-Montañés, D. Arumí



2. Models for Bridging Defects; M. Renovell, F. Azais, J. Figueras, R. Rodriguez-Montanes, D. Arumi



3. Models for Delay Faults; S.M. Reddy



4. Fault Modeling for Simulation and ATPG; B.Becker, I.Polian



5. Generalized Fault Modeling for Logic Diagnosis; H.-J. Wunderlich, S. Holst



6. Models in Memory Testing; S.Di Carlo, P.Prinetto



7. Models for Power-Aware Testing; P.Girard, H.-J.Wunderlich



8. Physical Fault Models and Fault Tolerance; J.Arlat, Y.Crouzet

Index.