Adonia Verlag: Advances in X-Ray Analysis - Newkirk, John B - Springer

Advances in X-Ray Analysis

Volume 10
Springer
ISBN 9781468478372
Taschenbuch/Paperback
CHF 60.20
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The featured subject of the 1966 Denver X-Ray Conference was X-Ray Diffraction Topography and Dynamical X-Ray Phenomena. One of the chairmen of the featured ses sions, Professor R. A. Young, made the following remarks at the conclusion of his session. We think they are quite appropriate to the occasion and with his permission we reproduce them here.
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